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1 Features •16-Mbit Flash and 2-Mbit/4-Mbit SRAM •Single 66-ball 8 mm x 10 mm x 1.2 mm CBGA Package •2.7V to 3.3V Operating Voltage Flash •2.7V to 3.3V Read/Write •AccessTime–85ns •Sector Erase Architecture – Thirty-one 32K Word (64K Byte) Sectors with Individual Write Lockout – Eight 4K Word (8K Byte) Sectors with Individual Write Lockout •Fast Word Program Time – 20 μs •Fast Sector Erase Time – 300 ms •Dual-plane Organization, Permitting Concurrent Read While Program/Erase – Memory Plane A: Eight 4K Word and Seven 32K Word Sectors – Memory Plane B: Twenty-four 32K Word Sectors •Erase Suspend Capability – Supports Reading and Programming from Any Sector by Suspending Erase of a Different Sector – Supports Reading Any Word by Suspending Programming of Any Other Word •Low-power Operation –30mAActive – 10 μA Standby •DataPolling, Toggle Bit, Ready/Busyfor End of Program Detection •VPP Pin for Accelerated Program/Erase Operations •RESETInput for Device Initialization •Sector Lockdown Support •Top/Bottom Block Configuration •128-bit Protection Register SRAM •2-megabit (128K x 16)/4-megabit (256K x 16) •2.7V to 3.3V V CC Operating Voltage •70 ns Access Time •Fully Static Operation and Tri-state Output •1.2V (Min) Data Retention •Industrial Temperature Range Device Number Flash Plane Architecture Flash Configuration SRAM Configuration AT52BR1672(T)12M + 4M16M (1M x 16)2M (128K x 16) AT52BR1674(T)12M + 4M16M (1M x 16)4M (256K x 16) 16-megabit Flash and 2-megabit/ 4-megabit SRAM Stack Memory AT52BR1672(T) AT52BR1674(T) Preliminary Rev. 2604B–STKD–09/02